May
16th
ASMC 2011 – 22nd Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference | Saratoga Springs, NY US
May 16th - May 18th, 2011 (8:00AM - 12:00 PM)
Saratoga Hilton/Saratoga City Center , 534 Broadway
Saratoga Springs, NY US
Topic: Environment
Event Type: Conference
Tags: Apc, Cfm, Defect Inspection, Dfm, Equipment And Materials Processes, Equipment Reliability, Factory Automation, Green Factory, Lithography, manufacturing, Metrology, Yield Enhancement
Comments Off Register now for the IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC 2011) The conference provides a venue for industry professionals to network, learn and share knowledge on new and best-method semiconductor manufacturing practices and concepts. ASMC includes keynotes from GLOBALFOUNDRIES,IBM, and Tradition Equities. Highlights include tutorials on 3D IC and EUV Lithography. For a complete schedule, visit www.semi.org/asmc
URL: http://www.semi.org/asmc
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